CWE-1248: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
The security-sensitive hardware module contains semiconductor defects.
How it's found
Semiconductor Defects in Hardware Logic with Security-Sensitive Implications is typically found by tracing untrusted input from where it enters the system to the point where it is used without the check or neutralization this weakness describes, combining manual code review with dynamic testing.
A semiconductor device can fail for various reasons. While some are manufacturing and packaging defects, the rest are due to prolonged use or usage under extreme conditions. Some mechanisms that lead to semiconductor defects include encapsulation failure, die-attach failure, wire-bond failure, bulk-silicon defects, oxide-layer faults, aluminum-metal faults (including electromigration, corrosion of aluminum, etc.), and thermal/electrical stress. These defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected.
Consequences
- DoS: Instability: If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.
Mitigations
- Testing: While semiconductor-manufacturing companies implement several mechanisms to continuously improve the semiconductor manufacturing process to ensure reduction of defects, some defects can only be fixed after manufacturing. Post-manufacturing testing of silicon die is critical. Fault models such as stuck-at-0 or stuck-at-1 must be used to develop post-manufacturing test cases and achieve good coverage. Once the silicon packaging is done, extensive post-silicon testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.
- Operation: Operating the hardware outside device specification, such as at extremely high temperatures, voltage, etc., accelerates semiconductor degradation and results in defects. When these defects manifest as faults in security-critical, hardware modules, it results in compromise of security guarantees. Thus, operating the device within the specification is important.
Where this fits in a TurboPentest engagement
This weakness is not covered by the automated black-box pentest. IntegSec pentesters cover it in a manual engagement.
Frequently asked questions
What is CWE-1248?
The security-sensitive hardware module contains semiconductor defects.
How do you find Semiconductor Defects in Hardware Logic with Security-Sensitive Implications?
Semiconductor Defects in Hardware Logic with Security-Sensitive Implications is typically found by tracing untrusted input from where it enters the system to the point where it is used without the check or neutralization this weakness describes, combining manual code review with dynamic testing.
What is the impact of CWE-1248?
DoS: Instability: If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.
Does TurboPentest test for Semiconductor Defects in Hardware Logic with Security-Sensitive Implications?
This weakness is not covered by the automated black-box pentest. IntegSec pentesters cover it in a manual engagement.
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Written and reviewed by
Michel Chamberland - Founder & CEO, IntegSec
CISSP, OSCP, OSCE, CEH, GIAC, CCSK · 20+ years in offensive security
Michel has spent 20+ years on offensive security teams including IBM X-Force Red and Trustwave SpiderLabs, leading penetration tests, red team engagements, and breach response for Fortune 500 customers. He is the founder of IntegSec and the architect of TurboPentest.
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